Title :
Measurement of dielectric permittivity tensor, main directions and optical axises in single-axis and bi-axis crystals
Author :
Zvyagintsev, A.A. ; Strizhachenko, A.V. ; Chizhov, V.V.
Author_Institution :
Kharkov Nat. Univ., Ukraine
Abstract :
We have designed a method of measuring the permittivity tensor components, permittivity ellipsoid axes and optical axes of uniaxial crystals with tetragonal, hexagonal, trigonal symmetry, as well as biaxial crystals with rhombic symmetry.
Keywords :
crystal symmetry; dielectric materials; dielectric-loaded waveguides; microwave measurement; permittivity measurement; anisotropic dielectric filled rectangular waveguides; bi-axis crystals; dielectric permittivity tensor measurement; hexagonal symmetry crystals; microwave measurement techniques; optical axes measurement; orthogonal waveguide junctions; permittivity ellipsoid axes measurement; permittivity tensor main directions; permittivity tensor optical axises; single-axis crystals; tetragonal symmetry crystals; trigonal symmetry crystals; Anisotropic magnetoresistance; Crystals; Dielectric measurements; Electromagnetic waveguides; Geometrical optics; Optical devices; Optical waveguides; Organizing; Permittivity measurement; Tensile stress;
Conference_Titel :
Microwave and Telecommunication Technology, 2002. CriMiCo 2002. 12th International Conference
Print_ISBN :
966-7968-12-X
DOI :
10.1109/CRMICO.2002.1137348
