Title :
Definition of material parameters of industrial thin-film samples [magnetodielectric and gyrotropic materials]
Author :
Ermak, G.P. ; Mizernik, V.N. ; Shmat´ko, A.A.
Author_Institution :
IRE, NASU, Kharkov, Ukraine
Abstract :
The analytical expression for the reflection factor of the waveguide wave diffraction on a T-shaped branching of a waveguide, the majority of which is completely filled with a thin-film ferrite medium (isotropic or anisotropic), is solved. The results of the calculation of the absolute value and phase of the reflection factor and wavelength, permittivity, and permeability of a sample are given.
Keywords :
Fourier analysis; anisotropic media; dielectric thin films; electromagnetic wave diffraction; electromagnetic wave reflection; linear algebra; magnetic permeability; magnetic thin films; microwave measurement; permittivity; waveguide junctions; waveguide theory; Fourier methods; anisotropic media; filled waveguides; gyrotropic materials; industrial thin-film sample material parameter definition; isotropic media; linear algebraic equations; magnetodielectric materials; reflection factor absolute value; reflection factor phase; reflection factor wavelength; sample permeability; sample permittivity; thin-film ferrite media; waveguide T-shaped branches; waveguide wave diffraction reflection factor; Anisotropic magnetoresistance; Diffraction; Ferrites; Gyrotropism; Magnetic analysis; Magnetic anisotropy; Magnetic materials; Perpendicular magnetic anisotropy; Reflection; Transistors;
Conference_Titel :
Microwave and Telecommunication Technology, 2002. CriMiCo 2002. 12th International Conference
Print_ISBN :
966-7968-12-X
DOI :
10.1109/CRMICO.2002.1137362
