DocumentCode
2716412
Title
A Low Flicker Noise CMOS Mixer Using Two Resonating Inductors for Direct Conversion Receivers
Author
Park, Jinsung ; Lee, Chang-Ho ; Kim, Byung-Sung ; Laskar, J.
Author_Institution
Georgia Electron. Design Center, Georgia Inst. of Technol., Atlanta, GA
fYear
2006
fDate
11-16 June 2006
Firstpage
1705
Lastpage
1708
Abstract
This paper presents the design, implementation, and measurement of a novel low flicker noise RF mixer in a 0.18 mum CMOS process for C-band direct conversion receivers. The low flicker noise mixer is implemented by incorporating a double-balanced Gilbert-type configuration, the RF leakage-less current bleeding technique, and Cp resonating technique. By using two separate inductors at the node between the current bleeding devices and LO switches, conversion gain and flicker noise performance are significantly improved. Also, a double-balanced Gilbert-type mixer with current bleeding circuits without inductors is fabricated and measured for analysis and comparison purposes. The proposed mixer has a measured conversion gain of 16.1 dB, a measured IIP3 of -5 dBm, a measured noise figure of 9.8 dB at 1 MHz, and a flicker corner frequency of 125 kHz while consuming only 7mW of DC power. To the best of our knowledge, the proposed mixer shows the lowest flicker corner frequency (125 kHz) with a more than 15 dB of conversion gain in CMOS process
Keywords
CMOS integrated circuits; MMIC mixers; flicker noise; inductors; integrated circuit noise; microwave receivers; 0.18 micron; 1 MHz; 125 kHz; 16.1 dB; 7 mW; 9.8 dB; C-band; CMOS mixer; CMOS process; DC power; Gilbert type configuration; RF current bleeding; RF mixer; current bleeding circuits; direct conversion receivers; double-balanced Gilbert-type mixer; low flicker noise; resonating inductors; 1f noise; CMOS process; Frequency measurement; Gain measurement; Hemorrhaging; Inductors; Mixers; Noise measurement; Power measurement; Radio frequency; CMOS mixer; Gilbert-type mixer; current bleeding; direct conversion receiver; flicker noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location
San Francisco, CA
ISSN
0149-645X
Print_ISBN
0-7803-9541-7
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2006.249707
Filename
4015275
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