Title :
Millimeter-wave circuits and modules up to 500 GHz based on metamorphic HEMT technology for remote sensing and wireless communication applications
Author :
Schlechtweg, M. ; Tessmann, A. ; Kallfass, I. ; Leuther, A. ; Hurm, V. ; Massler, H. ; Riessle, M. ; Lösch, R. ; Ambacher, O.
Author_Institution :
Fraunhofer Inst. for Appl. Solid State Phys. IAF, Freiburg, Germany
Abstract :
Metamorphic high electron mobility transistor (mHEMT) technologies with 100, 50, and 35 nm gate lengths have been developed at Fraunhofer IAF for operation in the millimeter-wave frequency range up to 500 GHz. Based on these technologies, a variety of millimeter-wave monolithic integrated circuits (MMICs) has been realized employing grounded coplanar waveguides (GCPWs). To demonstrate the potential of these technologies, this paper presents some examples of MMICs and modules developed for use in next generation remote sensing and communication systems. Two four-stage cascode amplifier circuits for operation in the frequency ranges 220-325 GHz (H-band) and 325-500 GHz (WR-2.2 waveguide band) were realized using the 50 and 35 nm mHEMT technology, respectively. Furthermore, a 200 GHz active subharmonically-pumped heterodyne receiver MMIC based on the 100 nm mHEMT technology was realized.
Keywords :
coplanar waveguides; field effect MIMIC; high electron mobility transistors; Fraunhofer IAF; four-stage cascode amplifier circuits; frequency 220 GHz to 325 GHz; frequency 325 GHz to 500 GHz; gate lengths; grounded coplanar waveguides; high electron mobility transistor; metamorphic HEMT technology; millimeter-wave circuits; millimeter-wave monolithic integrated circuits; remote sensing application; size 100 nm; size 35 nm; size 50 nm; subharmonically-pumped heterodyne receiver MMIC; wireless communication applications; Frequency measurement; Gain; Logic gates; MMICs; Receivers; Scattering parameters; mHEMTs;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2011 IEEE 9th International
Conference_Location :
Bordeaux
Print_ISBN :
978-1-61284-135-9
DOI :
10.1109/NEWCAS.2011.5981307