Title :
Multi-label ReliefF and F-statistic feature selections for image annotation
Author :
Kong, Deguang ; Ding, Chris ; Huang, Heng ; Zhao, Haifeng
Author_Institution :
Dept. of CSE, Univ. of Texas at Arlington, Arlington, TX, USA
Abstract :
The classical ReliefF and F-statistic feature selections can not be directly applied into multi-label problems due to the ambiguity produced from a data point attributed to multiple classes simultaneously. In this paper, we present MReliefF and MF-statistic algorithms for multi-label feature selections. Discriminant features are selected to boost the multi-label classification accuracy. The proposed MReliefF and MF-statistic can be used in image categorization and annotation problems. Extensive experiments on image annotation tasks show the good performance of our approach. To our knowledge, this is the first work to generalize the ReliefF and F-statistic feature selection algorithms for multi-label image annotation tasks.
Keywords :
feature extraction; image classification; statistical analysis; F-statistic feature selections; MF-statistic algorithms; MReliefF; discriminant features; image annotation; image categorization; multilabel ReliefF; multilabel classification accuracy; multilabel feature selections; Buildings; Educational institutions; Feature extraction; Image color analysis; Semantics; Standards; Support vector machines;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location :
Providence, RI
Print_ISBN :
978-1-4673-1226-4
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2012.6247947