• DocumentCode
    2716947
  • Title

    Robust Non-negative Graph Embedding: Towards noisy data, unreliable graphs, and noisy labels

  • Author

    Zhang, Hanwang ; Zha, Zheng-Jun ; Yan, Shuicheng ; Wang, Meng ; Chua, Tat-Seng

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2012
  • fDate
    16-21 June 2012
  • Firstpage
    2464
  • Lastpage
    2471
  • Abstract
    Non-negative data factorization has been widely used recently. However, existing techniques, such as Non-negative Graph Embedding (NGE), often suffer from noisy data, unreliable graphs, and noisy labels, which are commonly encountered in real-world applications. To address these issues, in this paper, we propose a Robust Non-negative Graph Embedding (RNGE) framework. The joint sparsity in both graph embedding and reconstruction endues the robustness of RNGE. We develop an elegant multiplicative updating solution that can solve RNGE efficiently and prove the convergence rigourously. RNGE is robust to unreliable graphs, as well as both sample and label noises in training data. Moreover, RNGE provides a general formulation such that all the algorithms unified with the graph embedding framework can be easily extended to obtain their robust non-negative solutions. We conduct extensive experiments on four real-world datasets and compared the proposed RNGE to NGE and other representative non-negative data factorization and subspace learning methods. The experimental results demonstrate the effectiveness and robustness of RNGE.
  • Keywords
    graph theory; image reconstruction; data reconstruction; elegant multiplicative updating solution; noisy data; noisy label; nonnegative data factorization; robust nonnegative graph embedding; unreliable graph; Algorithm design and analysis; Convergence; Noise; Noise measurement; Principal component analysis; Robustness; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
  • Conference_Location
    Providence, RI
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4673-1226-4
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2012.6247961
  • Filename
    6247961