Title :
Metric learning with two-dimensional smoothness for visual analysis
Author :
Xinlei Chen ; Zifei Tong ; Haifeng Liu ; Deng Cai
Author_Institution :
State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
Abstract :
In recent years, metric learning methods based on pairwise side information have attracted considerable interests, and lots of efforts have been devoted to utilize these methods for visual analysis like content based image retrieval and face identification. When applied to image analysis, these methods merely look on an n1 × n2 image as a vector in Rn1×n2 space and the pixels of the image are considered as independent. They fail to consider the fact that an image represented in the plane is intrinsically a matrix, and pixels spatially close to each other may probably be correlated. Even though we have n1 × n2 pixels per image, this spatial correlation suggests the real number of freedom is far less. In this paper, we introduce a regularized metric learning framework, Two-Dimensional Smooth Metric Learning (2DSML), which uses a discretized Laplacian penalty to restrict the coefficients to be two-dimensional smooth. Many existing metric learning algorithms can fit into this framework and learn a spatially smooth metric which is better for image applications than their original version. Recognition, clustering and retrieval can be then performed based on the learned metric. Experimental results on benchmark image datasets demonstrate the effectiveness of our method.
Keywords :
correlation methods; image representation; learning (artificial intelligence); 2DSML; content based image retrieval; discretized Laplacian penalty; face identification; image analysis; image application; image dataset; image pixel; image representation; metric learning algorithm; pairwise side information; regularized metric learning framework; spatial correlation; two-dimensional smooth metric learning; visual analysis; Euclidean distance; Face; Laplace equations; Smoothing methods; Vectors; Visualization;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location :
Providence, RI
Print_ISBN :
978-1-4673-1226-4
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2012.6247970