Title :
Experiment Test and Evaluation of a GMSK chipset compatible with the GSM PCS standard
Author :
Fu, Huajing ; Feher, Kamilo
Keywords :
Baseband; Bit error rate; Frequency shift keying; GSM; Low pass filters; Modulation; Personal communication networks; Semiconductor device measurement; Signal processing; Testing;
Conference_Titel :
Consumer Electronics, 1995., Proceedings of International Conference on
Print_ISBN :
0-7803-2140-5
DOI :
10.1109/ICCE.1995.518013
