A Compact 600 GHz Electronically Tunable Vector Measurement System for Submillimeter Wave Imaging

Author

Dengler, Robert J. ; Maiwald, Frank ; Siegel, Peter H.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA

fYear

2006

fDate

11-16 June 2006

Firstpage

1923

Lastpage

1926

Abstract

A compact submillimeter wave transmission/reflection measurement system has been demonstrated at 560-635 GHz, with electronic tuning over the entire band. Maximum dynamic range measured at a single frequency is 90 dB (60 dB typical), and phase noise is less than +/- 2deg. By using a frequency steerable lens at the source output and mixer input, the frequency agility of the system can be used to scan the source and receive beams, resulting in near real-time imaging capability using only a single pixel

Keywords

electromagnetic wave reflection; electromagnetic wave transmission; lenses; network analysers; phase measurement; submillimetre wave imaging; submillimetre wave measurement; 560 to 635 GHz; electronic tuning; electronically tunable vector measurement; frequency agility; frequency steerable lens; phase measurement; real-time imaging; submillimeter wave imaging; submillimeter wave reflection measurement; submillimeter wave transmission measurement; Acoustic reflection; Dynamic range; Frequency measurement; Noise measurement; Optical reflection; Phase measurement; Submillimeter wave devices; Submillimeter wave measurements; Submillimeter wave propagation; Tuning; Submillimeter wave imaging; Submillimeter wave mixers; phase measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2006. IEEE MTT-S International

Conference_Location

San Francisco, CA

ISSN

0149-645X

Print_ISBN

0-7803-9541-7

Electronic_ISBN

0149-645X

Type

conf

DOI

10.1109/MWSYM.2006.249792

Filename

4015334