DocumentCode
2717355
Title
On-Wafer Vector Network Analyzer Measurements in the 220-325 GHz Frequency Band
Author
Fung, A.K. ; Dawson, D. ; Samoska, L. ; Lee, K. ; Oleson, C. ; Boll, G.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
fYear
2006
fDate
11-16 June 2006
Firstpage
1931
Lastpage
1934
Abstract
We report on a full two-port on-wafer vector network analyzer test set for the 220-325 GHz (WR3) frequency band. The test set utilizes Oleson Microwave Labs frequency extenders with the Agilent 8510C network analyzer. Two port on-wafer measurements are made with GGB Industries coplanar waveguide (CPW) probes. With this test set we have measured the WR3 band S-parameters of amplifiers on-wafer, and the characteristics of the CPW wafer probes. Results for a three stage InP HEMT amplifier show 10 dB gain at 235 GHz as presented in D. Dawson et al. (2005), and that of a single stage amplifier, 2.9 dB gain at 231 GHz. The approximate upper limit of loss per CPW probe range from 3.0 to 4.8 dB across the WR3 frequency band
Keywords
HEMT integrated circuits; III-V semiconductors; MMIC amplifiers; S-parameters; coplanar waveguides; indium compounds; millimetre wave measurement; network analysers; probes; submillimetre wave measurement; two-port networks; 10 dB; 2.9 dB; 220 to 325 GHz; 3 to 4.8 dB; HEMT amplifier; InP; S-parameters measurement; WR3 frequency band; coplanar waveguide probes; frequency extenders; on-wafer measurements; single stage amplifier; vector network analyzer; wafer probes; Coplanar waveguides; Extraterrestrial measurements; Frequency measurement; Gain; HEMTs; Indium phosphide; MMICs; Probes; Scattering parameters; Testing; Coplanar Transmission Lines; Coplanar Waveguides; MMIC Amplifiers; Measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location
San Francisco, CA
ISSN
0149-645X
Print_ISBN
0-7803-9541-7
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2006.249811
Filename
4015336
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