• DocumentCode
    2717531
  • Title

    The thru-reflection-unequal-line (TRuL) calibration method with asymmetric R calibrator for multi-port scattering matrix measurement

  • Author

    Lu, Hsin-Chia ; Chou, Yien-Tien

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    1971
  • Lastpage
    1974
  • Abstract
    The multimode TRL calibration method is known as an approach for the measurement of multi-conductor transmission line devices. The propagation constants of different modes propagating along the multi-conductor transmission line must be different when using this method. However, in general multi-port networks, the propagating constants at each port may be equal. We here then present the thru-reflection-unequal-line (TRuL) calibration method for the calibration of the equal propagation constant case. Lines of unequal length are used to make the eigenvalues unequal during calibration process. This will greatly simplify the calculation. Asymmetric "R" calibrator is proposed to simplify the sign ambiguity resolution process. The measured scattering matrix of a branch line coupler on FR4 substrate using proposed calibration method shows good agreement with simulation
  • Keywords
    S-parameters; calibration; eigenvalues and eigenfunctions; multiconductor transmission lines; transmission line matrix methods; FR4 substrate; asymmetric R calibrator; branch line coupler; multiconductor transmission line devices; multimode TRL calibration; multiport networks; multiport scattering matrix measurement; propagation constants; sign ambiguity resolution; thru-reflection-unequal-line calibration; Calibration; Eigenvalues and eigenfunctions; Electric variables measurement; Linear matrix inequalities; Multiconductor transmission lines; Propagation constant; Reflection; Scattering parameters; Transmission line matrix methods; Transmission line measurements; calibration; multiport network; scattering parameters measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249821
  • Filename
    4015346