A statistical sampler for increasing analog circuits observability

Author

Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro A.

Author_Institution

Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil

fYear

2002

fDate

2002

Firstpage

141

Lastpage

145

Abstract

This paper presents a method of increasing the observability of analog circuits through the use of a statistical sampler. This sampler acquires statistical properties of the input signal. Its main advantages are simplicity, low analog area overhead and suitability for multi-channel acquisition, as only one-bit samplers are used. This qualifies it for use in a system-on-chip environment. The application of the statistical sampler to the test of analog circuits in a SOC environment is presented.

Keywords

analogue integrated circuits; integrated circuit testing; mixed analogue-digital integrated circuits; observability; signal sampling; spectral analysis; system-on-chip; 1 bit; analog circuit observability increase; analog testing; input signal statistical properties; mixed signal SOC; multi-channel acquisition; one-bit samplers; sampler simplicity/low analog area overhead; spectral analysis; statistical samplers; statistical sampling circuits; system-on-chip environment; Analog circuits; Application software; Cellular phones; Circuit testing; Costs; Digital signal processing; Integrated circuit technology; Observability; System testing; System-on-a-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Circuits and Systems Design, 2002. Proceedings. 15th Symposium on

Print_ISBN

0-7695-1807-9

Type

conf

DOI

10.1109/SBCCI.2002.1137650

Filename

1137650