مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2717794

Title :

Author index

fYear :

1996

fDate :

25-28 March 1996

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on

Conference_Location :

Trento, Italy

Print_ISBN :

0-7803-2783-7

Type :

conf

DOI :

10.1109/ICMTS.1996.535666

Filename :

535666

Link To Document :