Title :
Structural and dielectric characteristics of Bi2O3 -TiO2-SrB4O7 glasses
Author :
Varma, K.B.R. ; Shankar, M.V.
Author_Institution :
Mater. Res. Centre, Indian Inst. of Sci., Bangalore, India
Abstract :
Glasses of the composition 0.20 Bi2O3-0.30 TiO2-0.50 SrB4O7 and 0.30 Bi2O3-0.45 TiO2-0.25 SrB4O 7 have been fabricated by a conventional glass processing technique. These glasses have been characterized using X-ray powder diffraction (XRD), differential thermal analysis (DTA) and high resolution transmission electron microscopy (HRTEM). The frequency response of the dielectric constant and the loss tangent of these glasses has been studied. The formation of the crystalline bismuth titanate, Bi4Ti3O12 (BiT) phase in the heat treated samples has been confirmed by XRD and HRTEM studies. The measured ετ of the glass-ceramics is found to be in good agreement with those predicted by the logarithmic mixture rule. Optical second harmonic generation (SHG) at 1064 nm has been observed in the heat treated samples and is attributed to the formation of the crystalline Bi4Ti3O12 (BiT) phase in the SrB4O7 (SBO) matrix
Keywords :
X-ray diffraction; bismuth compounds; borate glasses; ceramics; crystallisation; dielectric losses; ferroelectric materials; glass structure; glass transition; heat treatment; optical harmonic generation; permittivity; strontium compounds; thermal analysis; titanium compounds; transmission electron microscopy; 1064 nm; Bi2O3-TiO2-SrB4O 7; Bi2O3-TiO2-SrB4O 7 glasses; Bi4Ti3O12; DTA; HRTEM; SHG; SrB4O7; SrB4O7 matrix; X-ray powder diffraction; XRD; conventional glass processing technique; crystalline Bi4Ti3O12 phase; dielectric characteristics; dielectric constant; differential thermal analysis; frequency response; glass-ceramics; heat treated samples; high resolution transmission electron microscopy; logarithmic mixture rule; loss tangent; optical second harmonic generation; structural characteristics; Bismuth; Crystallization; Dielectrics; Frequency response; Glass; Optical harmonic generation; Powders; Transmission electron microscopy; X-ray diffraction; X-ray scattering;
Conference_Titel :
Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
Conference_Location :
East Brunswick, NJ
Print_ISBN :
0-7803-3355-1
DOI :
10.1109/ISAF.1996.598148