DocumentCode :
2718243
Title :
SiC/Si and AlN/Si heterostructures for microelectromechanical RF sensors
Author :
Foerster, Ch. ; Cimalla, V. ; Lebedev, V. ; Cengher, D. ; Ambacher, O. ; Brueckner, K. ; Stephan, R. ; Hein, M.A.
Author_Institution :
Dept. of Nanotechnol., Technische Univ. Ilmenau, Germany
Volume :
2
fYear :
2004
fDate :
4-6 Oct. 2004
Firstpage :
371
Abstract :
Micromechanical SiC and AlN resonators with resonant frequencies between 170 kHz and 1.8 MHz have been prepared on silicon substrates by heteroepitaxial deposition of thin layers (∼200 nm) and subsequent dry etching. The resonators were operated by magnetomotive actuation and detection using a thin (∼50 nm) metallisation on top of the resonant beams. The strong RF driving signal masked the much weaker response of the resonators at resonance. Different methods to overcome this problem are proposed, namely (i) differential measurements, (ii) separation of excitation and detection by using coupled resonators, or an additional (e.g., capacitive) read-out electrode, and (iii) piezoelectric actuation.
Keywords :
III-V semiconductors; aluminium compounds; etching; micromechanical resonators; microsensors; semiconductor device metallisation; semiconductor heterojunctions; semiconductor thin films; silicon compounds; wide band gap semiconductors; 170 kHz to 1.8 MHz; 200 nm; 50 nm; AlN-Si; AlN/Si heterostructure; SiC-Si; SiC-Si heterostructure; additional read out electrode; coupled resonators; differential measurements; dry etching; magnetomotive actuation; magnetomotive detection; microelectromechanical RF sensors; microelectromechanical radiofrequency sensors; micromechanical AlN resonators; micromechanical SiC resonators; piezoelectric actuation; resonant beams; resonant frequency; silicon substrate; thin layer heteroepitaxial deposition; thin metallisation; weaker response; Dry etching; Magnetic resonance; Magnetic sensors; Magnetic separation; Metallization; Micromechanical devices; Radio frequency; Resonant frequency; Silicon carbide; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2004. CAS 2004 Proceedings. 2004 International
Print_ISBN :
0-7803-8499-7
Type :
conf
DOI :
10.1109/SMICND.2004.1403020
Filename :
1403020
Link To Document :
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