Title :
Frequency domain concurrent error detection in DSP systems
Author :
Yousefi, R. ; Fakhraie, S.M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran
Abstract :
A low cost invariant-based online test scheme is proposed for general digital linear time-invariant (LTI) systems. An analytical signal processing approach is used to extract an invariant property of LTI systems in frequency domain. An optimal implementation of the developed technique is also proposed using Goertzel algorithm to reduce area and computational overheads. The overhead is fixed and does not increase as complexity of LTI system increases. Simulation of fault detection capability is done for different filters using developed FLI fault injector platform. This work introduces the frequency domain approach in testing of digital signal processing systems.
Keywords :
signal processing; DSP systems; Goertzel algorithm; computational overheads; frequency domain concurrent error detection; general digital linear time-invariant systems; low cost invariant-based online test scheme; Circuit faults; Circuit testing; Costs; Digital signal processing; Electrical fault detection; Equations; Frequency domain analysis; Signal processing algorithms; System testing; Very large scale integration;
Conference_Titel :
Innovations in Information Technology, 2008. IIT 2008. International Conference on
Conference_Location :
Al Ain
Print_ISBN :
978-1-4244-3396-4
Electronic_ISBN :
978-1-4244-3397-1
DOI :
10.1109/INNOVATIONS.2008.4781742
