Frequency domain concurrent error detection in DSP systems

Author

Yousefi, R. ; Fakhraie, S.M.

Author_Institution

Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran

fYear

2008

fDate

16-18 Dec. 2008

Firstpage

54

Lastpage

58

Abstract

A low cost invariant-based online test scheme is proposed for general digital linear time-invariant (LTI) systems. An analytical signal processing approach is used to extract an invariant property of LTI systems in frequency domain. An optimal implementation of the developed technique is also proposed using Goertzel algorithm to reduce area and computational overheads. The overhead is fixed and does not increase as complexity of LTI system increases. Simulation of fault detection capability is done for different filters using developed FLI fault injector platform. This work introduces the frequency domain approach in testing of digital signal processing systems.

Keywords

signal processing; DSP systems; Goertzel algorithm; computational overheads; frequency domain concurrent error detection; general digital linear time-invariant systems; low cost invariant-based online test scheme; Circuit faults; Circuit testing; Costs; Digital signal processing; Electrical fault detection; Equations; Frequency domain analysis; Signal processing algorithms; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Innovations in Information Technology, 2008. IIT 2008. International Conference on

Conference_Location

Al Ain

Print_ISBN

978-1-4244-3396-4

Electronic_ISBN

978-1-4244-3397-1

Type

conf

DOI

10.1109/INNOVATIONS.2008.4781742

Filename

4781742