Detection of faults in ECL storage elements

Author

Menon, Sankaran M. ; Nymoen, Arne

Author_Institution

Dept. of Electr. & Comput. Eng., South Dakota Sch. of Mines & Technol., Rapid City, SD, USA

fYear

1995

fDate

7-8 Aug 1995

Firstpage

48

Lastpage

53

Abstract

Bipolar emitter-coupled logic (ECL) devices can be fabricated at very high densities and much lower power consumption. Analysis of faulty behavior of ECL storage elements shows they exhibit stuck-at behavior, loss of complementarity, delay faults and enhanced current being drawn by the device. Detection of the above behavior under faults using logic monitoring requires careful and systematic generation of input vectors. Testing for delay faults is even more difficult. A fault causing a delay fault as well as enhanced power supply current is shown. A current monitor for the detection of the enhanced power supply current is presented

Keywords

VLSI; bipolar memory circuits; complementarity; delays; electric current measurement; emitter-coupled logic; failure analysis; fault diagnosis; integrated circuit testing; power consumption; ECL storage elements; bipolar emitter-coupled logic devices; complementarity loss; current monitor; delay faults; enhanced power supply current; fault detection; faulty behavior analysis; faulty testing; high-density device fabrication; logic monitoring; power consumption; stuck-at faults; systematic input vector generation; Circuit faults; Costs; Current supplies; Delay; Fault detection; Logic devices; Monitoring; Power supplies; Semiconductor device modeling; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Memory Technology, Design and Testing, 1995., Records of the 1995 IEEE International Workshop on

Conference_Location

San Jose, CA

Print_ISBN

0-8186-7102-5

Type

conf

DOI

10.1109/MTDT.1995.518081

Filename

518081