Title :
Detection of faults in ECL storage elements
Author :
Menon, Sankaran M. ; Nymoen, Arne
Author_Institution :
Dept. of Electr. & Comput. Eng., South Dakota Sch. of Mines & Technol., Rapid City, SD, USA
Abstract :
Bipolar emitter-coupled logic (ECL) devices can be fabricated at very high densities and much lower power consumption. Analysis of faulty behavior of ECL storage elements shows they exhibit stuck-at behavior, loss of complementarity, delay faults and enhanced current being drawn by the device. Detection of the above behavior under faults using logic monitoring requires careful and systematic generation of input vectors. Testing for delay faults is even more difficult. A fault causing a delay fault as well as enhanced power supply current is shown. A current monitor for the detection of the enhanced power supply current is presented
Keywords :
VLSI; bipolar memory circuits; complementarity; delays; electric current measurement; emitter-coupled logic; failure analysis; fault diagnosis; integrated circuit testing; power consumption; ECL storage elements; bipolar emitter-coupled logic devices; complementarity loss; current monitor; delay faults; enhanced power supply current; fault detection; faulty behavior analysis; faulty testing; high-density device fabrication; logic monitoring; power consumption; stuck-at faults; systematic input vector generation; Circuit faults; Costs; Current supplies; Delay; Fault detection; Logic devices; Monitoring; Power supplies; Semiconductor device modeling; Very large scale integration;
Conference_Titel :
Memory Technology, Design and Testing, 1995., Records of the 1995 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-7102-5
DOI :
10.1109/MTDT.1995.518081
