• DocumentCode
    2718775
  • Title

    On Rejecting Outliers by Smirnov Test for Massive Data Input System in Vegetable Geographical Origin Identification System

  • Author

    Sato, Nobuyoshi ; Uehara, Minoru ; Shimomura, Koichiro ; Yamamoto, Hirobumi ; Kamijo, Kenichi

  • Author_Institution
    Plant Regul. Res. Center, Toyo Univ., Itakura
  • fYear
    2007
  • fDate
    21-23 May 2007
  • Firstpage
    340
  • Lastpage
    347
  • Abstract
    As co-work with agricultural chemists, we developed a vegetable geographical origin identification system using trace element composition to solve cultivated place forging problems on vegetables in Japan. Vegetables cultivated in farm fields absorb trace metal elements from soil. Here, trace element means that very small quantity elements in chemistry. Since trace element compositions in soil differ from districts, trace element composition of cultivated vegetables also differs from districts, even farms. Our system can identify geographical origin of vegetables in short time by comparing trace element composition of doubtful vegetable and genuine vegetables. Therefore, trace element compositions of vegetables must be measured when they are shipped from farms. Normally, since fresh vegetables are sold in the same day of shipping, trace element compositions must be measured and recorded into databases in few hours, before they will arrive at market, sold to general consumers. In this paper, we describe a massive data gather system for our system which rejects outliers. In addition, we describe an interface between our system and measurement instruments that are PC/WS based but closed system.
  • Keywords
    agricultural products; farming; geographic information systems; goods distribution; identification technology; Smirnov test; agricultural chemists; cultivated place forging problems; farm fields; massive data input system; trace element compositions; trace metal elements; vegetable cultivation; vegetable geographical origin identification system; Agricultural products; Chemical elements; Chemistry; Computer science; Databases; Delay; Instruments; RFID tags; Soil; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Information Networking and Applications, 2007. AINA '07. 21st International Conference on
  • Conference_Location
    Niagara Falls, ON
  • ISSN
    1550-445X
  • Print_ISBN
    0-7695-2846-5
  • Type

    conf

  • DOI
    10.1109/AINA.2007.99
  • Filename
    4220913