DocumentCode
2718775
Title
On Rejecting Outliers by Smirnov Test for Massive Data Input System in Vegetable Geographical Origin Identification System
Author
Sato, Nobuyoshi ; Uehara, Minoru ; Shimomura, Koichiro ; Yamamoto, Hirobumi ; Kamijo, Kenichi
Author_Institution
Plant Regul. Res. Center, Toyo Univ., Itakura
fYear
2007
fDate
21-23 May 2007
Firstpage
340
Lastpage
347
Abstract
As co-work with agricultural chemists, we developed a vegetable geographical origin identification system using trace element composition to solve cultivated place forging problems on vegetables in Japan. Vegetables cultivated in farm fields absorb trace metal elements from soil. Here, trace element means that very small quantity elements in chemistry. Since trace element compositions in soil differ from districts, trace element composition of cultivated vegetables also differs from districts, even farms. Our system can identify geographical origin of vegetables in short time by comparing trace element composition of doubtful vegetable and genuine vegetables. Therefore, trace element compositions of vegetables must be measured when they are shipped from farms. Normally, since fresh vegetables are sold in the same day of shipping, trace element compositions must be measured and recorded into databases in few hours, before they will arrive at market, sold to general consumers. In this paper, we describe a massive data gather system for our system which rejects outliers. In addition, we describe an interface between our system and measurement instruments that are PC/WS based but closed system.
Keywords
agricultural products; farming; geographic information systems; goods distribution; identification technology; Smirnov test; agricultural chemists; cultivated place forging problems; farm fields; massive data input system; trace element compositions; trace metal elements; vegetable cultivation; vegetable geographical origin identification system; Agricultural products; Chemical elements; Chemistry; Computer science; Databases; Delay; Instruments; RFID tags; Soil; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Information Networking and Applications, 2007. AINA '07. 21st International Conference on
Conference_Location
Niagara Falls, ON
ISSN
1550-445X
Print_ISBN
0-7695-2846-5
Type
conf
DOI
10.1109/AINA.2007.99
Filename
4220913
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