• DocumentCode
    2718852
  • Title

    Research of reduced-order modeling for dynamic voltage stability analysis of power system

  • Author

    Li, Peng ; Zhang, Baohui ; Shu, Jin ; Hao, Zhiguo ; Klimek, Andrew ; Bo, Zhiqian ; Wang, Chenggen ; Wang, Yuting

  • Author_Institution
    Sch. of Electr. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
  • fYear
    2009
  • fDate
    26-30 Oct. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Dynamic voltage stability analysis is mainly based on the time-domain solution of power system differential equations. The modeling of each power element has a great influence on the correctness and complexity of stability analyzing. It is a significant work to model appropriately for simplifying calculation and drawing out principal contradiction. Firstly, the dynamical mechanism of voltage stability is summarized. More, this paper employs the perturbation method and integral manifold theory as a tool for studying on the relationship of stability between the reduced-order system and original system. An important conclusion is reached that the power system quasi-steady-state model can be used for dynamic voltage stability analysis. At the same time, it must be caution to neglect the dynamic of the load in voltage stability analysis.
  • Keywords
    differential equations; power system stability; dynamic voltage stability analysis; integral manifold theory; perturbation method; power system differential equations; power system quasi-steady-state model; reduced-order modeling; time-domain solution; Differential equations; Perturbation methods; Power system analysis computing; Power system dynamics; Power system modeling; Power system stability; Reduced order systems; Stability analysis; Time domain analysis; Voltage; Voltage stability; fast and slow dynamics; power system modeling; reduced order modeling; singular perturbation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission & Distribution Conference & Exposition: Asia and Pacific, 2009
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-5230-9
  • Electronic_ISBN
    978-1-4244-5230-9
  • Type

    conf

  • DOI
    10.1109/TD-ASIA.2009.5356822
  • Filename
    5356822