• DocumentCode
    271890
  • Title

    Safety evaluation of automotive electronics using Virtual Prototypes: State of the art and research challenges

  • Author

    Oetjens, J.-H. ; Bannow, N. ; Becker, Matthias ; Bringmann, Oliver ; Burger, A. ; Chaari, M. ; Chakraborty, Shiladri ; Drechsler, Rolf ; Ecker, Wolfgang ; Gruttner, Kim ; Kruse, T. ; Kuznik, Christoph ; Le, Hoang M. ; Mauderer, A. ; Müller, W. ; Mülle

  • Author_Institution
    Robert Bosch GmbH, Stuttgart, Germany
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Intelligent automotive electronics significantly improved driving safety in the last decades. With the increasing complexity of automotive systems, dependability of the electronic components themselves and of their interaction must be assured to avoid any risk to driving safety due to unexpected failures caused by internal or external faults. Additionally, Virtual Prototypes (VPs) have been accepted in many areas of system development processes in the automotive industry as platforms for SW development, verification, and design space exploration. We believe that VPs will significantly contribute to the analysis of safety conditions for automotive electronics. This paper shows the advantages of such a methodology based on today´s industrial needs, presents the current state of the art in this field, and outlines upcoming research challenges that need to be addressed to make this vision a reality.
  • Keywords
    automotive electronics; traffic engineering computing; virtual prototyping; SW development; design space exploration; electronic component; intelligent automotive electronics; safety evaluation; verification; virtual prototype; Automotive engineering; Integrated circuit modeling; Prototypes; Reliability; Safety; Stress; Unified modeling language; Automotive; Embedded Systems; Reliability; Robustness; Safety; Virtual Prototypes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2593069.2602976
  • Filename
    6881440