DocumentCode :
271894
Title :
The EDA challenges in the dark silicon era
Author :
Shafique, Muhammad ; Garg, Shelly ; Henkel, Jörg ; Marculescu, Diana
Author_Institution :
Dept. of Embedded Syst., Karlsruhe Inst. of Technol., Karlsruhe, Germany
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
1
Lastpage :
6
Abstract :
Technology scaling has resulted in smaller and faster transistors in successive technology generations. However, transistor power consumption no longer scales commensurately with integration density and, consequently, it is projected that in future technology nodes it will only be possible to simultaneously power on a fraction of cores on a multi-core chip in order to stay within the power budget. The part of the chip that is powered off is referred to as dark silicon and brings new challenges as well as opportunities for the design community, particularly in the context of the interaction of dark silicon with thermal, reliability and variability concerns. In this perspectives paper we describe these new challenges and opportunities, and provide preliminary experimental evidence in their support.
Keywords :
electronic design automation; integrated circuit design; power consumption; semiconductor device reliability; thermal management (packaging); transistors; EDA; dark silicon era; integration density; multicore chip; technology scaling; transistor power consumption; Integrated circuit reliability; Multicore processing; Program processors; Silicon; Threshold voltage; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1145/2593069.2593229
Filename :
6881512
Link To Document :
بازگشت