Title :
A new single shot terahertz time domain spectrometer for rapid product and process control
Author :
Schmidhammer, U. ; De Waele, V. ; Jeunesse, P.
Author_Institution :
Lab. de Chimie Phys., Univ. Paris Sud, Orsay, France
Abstract :
A new simple time-domain THz spectrometer based on a single-shot balanced detection of the electric field is presented. It allows for the recording of the full temporal THz profile at kHz acquisition rates. Its performances are demonstrated by measuring the fast drying process of acetone on Teflon.
Keywords :
infrared spectrometers; process control; production control; THz spectrometer; fast drying process; rapid product and process control; single shot terahertz time domain spectrometer; Electric fields; Nonlinear optics; Optical amplifiers; Optical pulses; Optical sensors; Time domain analysis; Ultrafast optics;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612963
