Title :
Accuracy bounds in switching activity estimation
Author :
Hill, Anthony M. ; Kang, Sung-Mo Steve
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
Calculation of switching densities in digital ICs is necessary for both power and reliability estimation. Discrete simulation-based methods are popular since they can produce accurate estimates of switching density. However, a number of unresolved problems such as estimating the required number of input patterns hinder this technique. In this paper, we address the issue of obtaining an a-priori estimate for the number of simulation patterns required for a specified accuracy. By approximating each signal as a binomial random variable and using the normal approximation to the binomial distribution, we obtain bounds on the number of required patterns. Experimental data shows that our model produces a tight bound on the minimum number of required patterns
Keywords :
circuit analysis computing; digital integrated circuits; digital simulation; integrated circuit design; integrated circuit packaging; integrated circuit reliability; switching functions; IC reliability; a-priori estimate; binomial random variable; digital ICs; normal approximation; packaging design; power estimation; reliability estimation; simulation patterns; switching activity estimation; switching densities; tight bound; Analytical models; Circuit simulation; Computational modeling; Logic circuits; Power dissipation; Power system modeling; Power system reliability; Random variables; Statistics; Switching circuits;
Conference_Titel :
Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-2584-2
DOI :
10.1109/CICC.1995.518140