DocumentCode
2719136
Title
Contour-based recognition
Author
Yong Xu ; Yuhui Quan ; Zhuming Zhang ; Hui Ji ; Fermuller, Cornelia ; Nishigaki, Masakatsu ; DeMenthon, Daniel
Author_Institution
Sch. of Comput. Sci. & Eng., South China Univ. of Tech., Guangzhou, China
fYear
2012
fDate
16-21 June 2012
Firstpage
3402
Lastpage
3409
Abstract
Contour is an important cue for object recognition. In this paper, built upon the concept of torque in image space, we propose a new contour-related feature to detect and describe local contour information in images. There are two components for our proposed feature: One is a contour patch detector for detecting image patches with interesting information of object contour, which we call the Maximal/Minimal Torque Patch (MTP) detector. The other is a contour patch descriptor for characterizing a contour patch by sampling the torque values, which we call the Multi-scale Torque (MST) descriptor. Experiments for object recognition on the Caltech-101 dataset showed that the proposed contour feature outperforms other contour-related features and is on a par with many other types of features. When combing our descriptor with the complementary SIFT descriptor, impressive recognition results are observed.
Keywords
edge detection; feature extraction; object recognition; MST descriptor; MTP detector; SIFT descriptor; contour patch descriptor; contour patch detector; contour-based recognition; contour-related feature; image patches detection; image space; local contour information detection; maximal-minimal torque patch; multiscale torque; object contour; object recognition; torque value; Detectors; Feature extraction; Force; Image edge detection; Shape; Torque; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location
Providence, RI
ISSN
1063-6919
Print_ISBN
978-1-4673-1226-4
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2012.6248080
Filename
6248080
Link To Document