DocumentCode
2719142
Title
Forces analysis for micro-manipulation
Author
Rougeot, Patrick ; Regnier, Stephane ; Chaillet, Nicolas
Author_Institution
Lab. d´´Automatique de Besancon, LAB UMR CNRS - ENSMM - UFC, Besancon, France
fYear
2005
fDate
27-30 June 2005
Firstpage
105
Lastpage
110
Abstract
The aim of this article is to give an experimental analysis of the physical phenomena at a microscopic scale. In particular, this article presents experimental measurements based on an AFM system. These experiments show the influence of the contact forces and distance forces especially for micromanipulation applications.
Keywords
atomic force microscopy; micromanipulators; AFM based micromanipulation system; AMIS; atomic force microscope; forces analysis; Ambient intelligence; Atomic force microscopy; Automatic control; Equations; Force control; Force measurement; Particle measurements; Physics; Robotics and automation; Robots;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence in Robotics and Automation, 2005. CIRA 2005. Proceedings. 2005 IEEE International Symposium on
Print_ISBN
0-7803-9355-4
Type
conf
DOI
10.1109/CIRA.2005.1554262
Filename
1554262
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