Title :
Forces analysis for micro-manipulation
Author :
Rougeot, Patrick ; Regnier, Stephane ; Chaillet, Nicolas
Author_Institution :
Lab. d´´Automatique de Besancon, LAB UMR CNRS - ENSMM - UFC, Besancon, France
Abstract :
The aim of this article is to give an experimental analysis of the physical phenomena at a microscopic scale. In particular, this article presents experimental measurements based on an AFM system. These experiments show the influence of the contact forces and distance forces especially for micromanipulation applications.
Keywords :
atomic force microscopy; micromanipulators; AFM based micromanipulation system; AMIS; atomic force microscope; forces analysis; Ambient intelligence; Atomic force microscopy; Automatic control; Equations; Force control; Force measurement; Particle measurements; Physics; Robotics and automation; Robots;
Conference_Titel :
Computational Intelligence in Robotics and Automation, 2005. CIRA 2005. Proceedings. 2005 IEEE International Symposium on
Print_ISBN :
0-7803-9355-4
DOI :
10.1109/CIRA.2005.1554262
