Title :
Effects of single cycle binaural beat duration on auditory evoked potentials
Author :
Mihajloski, Todor ; Bohorquez, Jorge ; Özdamar, Özcan
Author_Institution :
Dept. of Biomed. Eng., Univ. of Miami, Coral Gables, FL, USA
Abstract :
Binaural beat (BB) illusions are experienced as continuous central pulsations when two sounds with slightly different frequencies are delivered to each ear. It has been shown that steady-state auditory evoked potentials (AEPs) to BBs can be captured and investigated. The authors recently developed a new method of evoking transient AEPs to binaural beats using frequency modulated stimuli. This methodology was able to create single BBs in predetermined intervals with varying carrier frequencies. This study examines the effects of the BB duration and the frequency modulating component of the stimulus on the binaural beats and their evoked potentials. Normal hearing subjects were tested with a set of four durations (25, 50, 100, and 200 ms) with two stimulation configurations, binaural dichotic (binaural beats) and diotic (frequency modulation). The results obtained from the study showed that out of the given durations, the 100 ms beat, was capable of evoking the largest amplitude responses. The frequency modulation effect showed a decrease in peak amplitudes with increasing beat duration until their complete disappearance at 200 ms. Even though, at 200 ms, the frequency modulation effects were not present, the binaural beats were still perceived and captured as evoked potentials.
Keywords :
auditory evoked potentials; frequency modulation; AEP; auditory evoked potentials; binaural dichotic configurations; continuous central pulsations; diotic configurations; frequency modulated stimuli; hearing subjects; single cycle binaural beat duration; steady-state auditory evoked potentials; time 200 ms; Ear; Electroencephalography; Frequency modulation; Morphology; Steady-state; Transient analysis;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
DOI :
10.1109/EMBC.2014.6944645