DocumentCode
2719760
Title
Separation of traveling waves in cortical networks using optical imaging
Author
Schmidt, Nicolas ; Peyré, Gabriel ; Frégnac, Yves ; Roland, Per
Author_Institution
Ceremade, Univ. Paris-Dauphine, Paris, France
fYear
2010
fDate
14-17 April 2010
Firstpage
868
Lastpage
871
Abstract
This paper introduces a mathematical model of the spatio-temporal patterns of visually evoked activity observed using Voltage-Sensitive Dye Imaging (VSDI) of the visual cortex. The cortical activity is described using a linear superposition of waves traveling with different speeds. This model improves the quality of the wave detection and still respects the previous approaches, as it integrates several biologically plausible constraints: 1) separability of the sources in terms of cortical location; 2) separability of the waves in terms of propagation speed, and 3) additivity of the depolarizing effects of the waves. Under these assumptions, a traveling component analysis algorithm performs a full separation of the set of waves and recovers the locations of the neural sources. Both features could help to better understand the dynamics of evoked activity in cortical sensory networks.
Keywords
biomedical optical imaging; brain; inverse problems; medical image processing; neurophysiology; signal reconstruction; source separation; visual evoked potentials; VSDI; cortical location; cortical networks; depolarizing effects; linear superposition; optical imaging; propagation speed; source separability; spatio-temporal patterns; traveling component analysis algorithm; traveling waves; visual cortex; visually evoked activity; voltage-sensitive dye imaging; wave detection; Biomedical optical imaging; Biomembranes; High-resolution imaging; Inverse problems; Optical feedback; Optical imaging; Optical propagation; Optical sensors; Spatial resolution; Voltage; Inverse problems; Optical imaging; Partial differential equations; Propagation; Signal reconstruction;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
Conference_Location
Rotterdam
ISSN
1945-7928
Print_ISBN
978-1-4244-4125-9
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2010.5490124
Filename
5490124
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