• DocumentCode
    2719886
  • Title

    Accurate optical constants of ZnTe measured by THz-TDS with their standard deviations

  • Author

    Tripathi, Saroj R. ; Aoki, Makoto ; Asahi, Toshiaki ; Hosako, Iwao ; Hiromoto, Norihisa

  • Author_Institution
    Grad. Sch. of Sci. & Technol., Shizuoka Univ., Shizuoka, Japan
  • fYear
    2010
  • fDate
    5-10 Sept. 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Accurate optical constants of the ZnTe are essential to optimize its performance as a terahertz emitter and detector. We measured the optical constants like complex refractive index of ZnTe crystal using transmission terahertz time domain spectroscopy (THz-TDS) from 0.2 to 3.5 THz at room temperature and their standard deviation is calculated to quantify the random errors. The uncertainty in sample thickness measurement, which is important to consider especially in transmission THz-TDS, is also incorporated to compute the resultant standard deviations in all optical constants. The percentage errors of real and imaginary parts of refractive index at 1 THz are 0.01 and 1.22 respectively.
  • Keywords
    II-VI semiconductors; refractive index; terahertz wave spectra; time resolved spectra; zinc compounds; THz-TDS; ZnTe; ZnTe crystal; complex refractive index; frequency 0.2 THz to 3.5 THz; optical constants; sample thickness measurement; temperature 293 K to 298 K; terahertz wave detector; terahertz wave emitter; transmission terahertz time domain spectroscopy; Absorption; Adaptive optics; Optical imaging; Optical refraction; Optical variables control; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-6655-9
  • Type

    conf

  • DOI
    10.1109/ICIMW.2010.5613015
  • Filename
    5613015