Title :
Scattering near-field microscopy in the THz region using a free-electron laser
Author :
Von Ribbeck, Hans-Georg ; Wenzel, Marc Tobias ; Jacob, Rainer ; Eng, Lukas M.
Author_Institution :
Inst. fur Angewandte Photophys., Tech. Univ. Dresden, Dresden, Germany
Abstract :
We present scattering-type scanning near-field optical micro-spectroscopy (s-SNOM) investigations successfully operated in the THz range with a wavelength independent spatial resolution of <; 150 nm. As a variable and monochromatic radiation source we use the free-electron laser (FELBE) located at the Forschungszentrum Dresden-Rossendorf (FZD) tunable over the wavelength range from 4-250 μm.
Keywords :
free electron lasers; near-field scanning optical microscopy; terahertz spectroscopy; FZD laser; Forschungszentrum Dresden-Rossendorf tunable laser; THz range; free electron laser; monochromatic radiation source; s-SNOM investigation; scattering-type scanning near field optical microspectroscopy; wavelength 4 mum to 250 mum; wavelength independent spatial resolution; Free electron lasers; Nonlinear optics; Optical diffraction; Optical pulses; Optical scattering; Optical surface waves; Spatial resolution;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5613022
