Title :
Proposal for a simplified CMOS VLSI fabrication sequence
Author :
Bellutti, P. ; Boscardin, M. ; Giacomozzi, F. ; Soncini, G. ; Zen, M. ; Zorzi, N.
Author_Institution :
Div. of Microsensors & Syst. Integration, IRST, Trento, Italy
Abstract :
A simple modification of the standard CMOS process flow has been recently proposed whose goal is the process simplification: the well formation and the local oxidation (typically separated process phases) in this proposed modified process (DW-LOCOS) are simultaneously obtained by performing the well drive-in in dry O2 ambient. The aim of this work is to outline the possible advantages and drawbacks of the DW-LOCOS implementation in a standard CMOS process
Keywords :
CMOS integrated circuits; VLSI; integrated circuit technology; oxidation; CMOS VLSI fabrication; DW-LOCOS; drive-in; dry O2 ambient; local oxidation; process flow; well formation;
Conference_Titel :
Improving the Efficiency of IC Manufacturing Technology, IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19950925