• DocumentCode
    2720607
  • Title

    BioLabs-On-A-Chip: Monitoring Cells using CMOS Biosensors

  • Author

    Prakash, Somashekar B. ; Nelson, Nicole M. ; Haas, Alfred M. ; Jeng, Victor ; Abshire, Pamela ; Urdaneta, Mario ; Smela, Elisabeth

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Maryland Univ., Baltimore, MD
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Cell clinics, CMOS/MEMS hybrid microsystems for capturing and in-situ investigation of living cells, aims at providing high-speed, automated, and economical cell monitoring. Integrated sensors are being developed for extracellular signal amplification, cell-substrate capacitance sensing, contact imaging, and fluorescence detection. We describe the methodology for characterizing the responses of these sensors to biological cells. We also present results obtained from the long-term monitoring of cells cultured on-chip using two of the sensors: (i) a bio-amplifier, used for amplifying weak extracellular potentials from electrically active cells, and (ii) a cell-substrate capacitance sensor, used for tracking cell adhesion and assessing cell viability
  • Keywords
    CMOS image sensors; adhesion; bioMEMS; bioelectric potentials; biosensors; cellular biophysics; fluorescence; lab-on-a-chip; microsensors; optical sensors; CMOS biosensors; CMOS/MEMS hybrid microsystems; bio-amplifier; biolabs-on-a-chip; capacitance sensor; cell adhesion; cell clinics; cell monitoring; cell viability; cell-substrate capacitance sensing; contact imaging; electrically active cells; extracellular potentials; extracellular signal amplification; fluorescence detection; integrated sensors; living cells; Biosensors; CMOS image sensors; Capacitance; Capacitive sensors; Cells (biology); Computerized monitoring; Extracellular; Image sensors; Micromechanical devices; Sensor phenomena and characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Life Science Systems and Applications Workshop, 2006. IEEE/NLM
  • Conference_Location
    Bethesda, MD
  • Print_ISBN
    1-4244-0277-8
  • Electronic_ISBN
    1-4244-0278-6
  • Type

    conf

  • DOI
    10.1109/LSSA.2006.250374
  • Filename
    4015845