DocumentCode
2720662
Title
Dielectric measurement of low loss-tangent dielectric near 100 GHz by a simplified hemispherical open resonator technique
Author
Srivastava, Anurag ; Kwon, Oh-joon ; Bera, Anirban ; Baik, In-Keun ; Park, Gun-Sik
Author_Institution
Dept. of Phys. & Astron., Seoul Nat. Univ., Seoul, South Korea
fYear
2010
fDate
5-10 Sept. 2010
Firstpage
1
Lastpage
1
Abstract
A high Q-hemispherical open resonator with W-band vector network analyzer enables a precise and fast determination of the permittivity and loss tangent of low-loss dielectrics near 100GHz. The implemented frequency variation method showed standard deviation in dielectric measurements less than 0.06.
Keywords
dielectric materials; dielectric measurement; network analysers; permittivity; resonators; W-band vector network analyzer; dielectric measurement; frequency 100 GHz; frequency variation method; high Q-hemispherical open resonator; loss tangent; low loss-tangent dielectric; low-loss dielectrics; permittivity; simplified hemispherical open resonator technique; standard deviation; Dielectric loss measurement; Extraterrestrial measurements; Frequency measurement; Permittivity; Permittivity measurement; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location
Rome
Print_ISBN
978-1-4244-6655-9
Type
conf
DOI
10.1109/ICIMW.2010.5613059
Filename
5613059
Link To Document