• DocumentCode
    2720759
  • Title

    Coupled label and intensity MRF models for IR target detection

  • Author

    Parag, Toufiq

  • Author_Institution
    Janelia Farm Res. Campus - HHMI, Asburn, VA, USA
  • fYear
    2011
  • fDate
    20-25 June 2011
  • Firstpage
    7
  • Lastpage
    13
  • Abstract
    This study formulates the IR target detection as a binary classification problem of each pixel. Each pixel is associated with a label which indicates whether it is a target or background pixel. The optimal label set for all the pixels of an image maximizes a posterior distribution of label configuration given the pixel intensities. The posterior probability is factored into (or proportional to) a conditional likelihood of the intensity values and a prior probability of label configuration. Each of these two probabilities are computed assuming a Markov Random Field (MRF) on both pixel intensities and their labels. In particular, this study enforces neighborhood dependency on both intensity values, by a Simultaneous Auto Regressive (SAR) modle, and on labels, by an Auto-Logistic model. The parameters of these MRF models are learned from labeled examples. During testing, an MRF inference technique, namely Iterated Conditional Mode (ICM), produces the optimal label for each pixel. High performances on benchmark datasets demonstrate effectiveness of this method for IR target detection.
  • Keywords
    Markov processes; autoregressive processes; image classification; inference mechanisms; infrared imaging; object detection; IR target detection; MRF inference technique; Markov random field; auto-logistic model; image maximization; intensity MRF models; iterated conditional mode; label configuration; pixel binary classification problem; posterior distribution; simultaneous auto regressive model; Computational modeling; Equations; Feature extraction; Inference algorithms; Markov random fields; Mathematical model; Object detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2011 IEEE Computer Society Conference on
  • Conference_Location
    Colorado Springs, CO
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4577-0529-8
  • Type

    conf

  • DOI
    10.1109/CVPRW.2011.5981725
  • Filename
    5981725