Title :
Coupled label and intensity MRF models for IR target detection
Author_Institution :
Janelia Farm Res. Campus - HHMI, Asburn, VA, USA
Abstract :
This study formulates the IR target detection as a binary classification problem of each pixel. Each pixel is associated with a label which indicates whether it is a target or background pixel. The optimal label set for all the pixels of an image maximizes a posterior distribution of label configuration given the pixel intensities. The posterior probability is factored into (or proportional to) a conditional likelihood of the intensity values and a prior probability of label configuration. Each of these two probabilities are computed assuming a Markov Random Field (MRF) on both pixel intensities and their labels. In particular, this study enforces neighborhood dependency on both intensity values, by a Simultaneous Auto Regressive (SAR) modle, and on labels, by an Auto-Logistic model. The parameters of these MRF models are learned from labeled examples. During testing, an MRF inference technique, namely Iterated Conditional Mode (ICM), produces the optimal label for each pixel. High performances on benchmark datasets demonstrate effectiveness of this method for IR target detection.
Keywords :
Markov processes; autoregressive processes; image classification; inference mechanisms; infrared imaging; object detection; IR target detection; MRF inference technique; Markov random field; auto-logistic model; image maximization; intensity MRF models; iterated conditional mode; label configuration; pixel binary classification problem; posterior distribution; simultaneous auto regressive model; Computational modeling; Equations; Feature extraction; Inference algorithms; Markov random fields; Mathematical model; Object detection;
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2011 IEEE Computer Society Conference on
Conference_Location :
Colorado Springs, CO
Print_ISBN :
978-1-4577-0529-8
DOI :
10.1109/CVPRW.2011.5981725