DocumentCode :
2720834
Title :
Fabrication of diamond tip cantilever and its application to tribo-nanolithography
Author :
Jong Kweon Park ; Jeong Woo Park
Author_Institution :
Dept. of Intelligence & Precision Machine, Korea Inst. of Machinery & Mater., Daejeon, South Korea
fYear :
2005
fDate :
27-30 June 2005
Firstpage :
695
Lastpage :
700
Abstract :
Nano-scale fabrication of silicon substrate based on the use of atomic force microscopy (AFM) was demonstrated. A specially designed cantilever with diamond tip, allowing the formation of damaged layer on silicon substrate by a simple scratching process, has been applied instead of conventional silicon cantilever for scanning. A thin damaged layer forms in the substrate at the diamond tip-sample junction along scanning path of the tip. The damaged layer withstands against wet chemical etching in aqueous KOH solution. Diamond tip acts as a patterning tool like mask film for lithography process. Hence these sequential processes, called tribo-nanolithography, TNL, can fabricate 2D or 3D micro structures in nanometer range. This study demonstrates the novel fabrication processes of the micro cantilever and diamond tip as a tool for TNL using micro-patterning, wet chemical etching and CVD. The developed TNL tools show outstanding machinability against single crystal silicon wafer. Hence, they are expected to have a possibility for industrial applications as a micro-to-nano machining tool.
Keywords :
atomic force microscopy; chemical vapour deposition; etching; micromachining; nanolithography; 2D microstructure fabrication; 3D microstructure fabrication; CVD; aqueous KOH solution; atomic force microscopy; crystal silicon wafer; diamond tip cantilever fabrication; micro cantilever; micro-patterning; micromachining; nano-scale fabrication; nanomachining; silicon substrate; tribo-nanolithography; wet chemical etching; Atomic force microscopy; Atomic layer deposition; Chemical processes; Chemical vapor deposition; Fabrication; Lithography; Nanostructures; Silicon; Substrates; Wet etching; AFM (Atomic Force Microscope); Cantilever; Diamond tip; Nano-scale fabrication; TNL (Tribo-nanolithography);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence in Robotics and Automation, 2005. CIRA 2005. Proceedings. 2005 IEEE International Symposium on
Print_ISBN :
0-7803-9355-4
Type :
conf
DOI :
10.1109/CIRA.2005.1554358
Filename :
1554358
Link To Document :
بازگشت