• DocumentCode
    2720915
  • Title

    [Copyright notice]

  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The following topics are dealt with: 3D interconnection bonding; next generation packaging reliability; MEMS integration; signal and power analysis; LED; optoelectronics integration; 3D reliability; interposer technology; sensors; conductive and nonconductive adhesives; advanced flip chip underfill assembly; solder and material characterization; 3D TSV manufacturing; flip chip interconnect and electromigration; 3D electrical analysis; lead free solders; innovative test methods; 3D ecosystem codesign; RF packaging; area array packages; advanced wire bonding; wafer level manufacturing; thermal interface materials; optical interconnects; and integrated microfluidics.
  • Keywords
    adhesion; electromigration; flip-chip devices; integrated circuit bonding; integrated circuit design; integrated circuit manufacture; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; integrated optoelectronics; lead bonding; light emitting diodes; microfluidics; optical interconnections; sensors; solders; three-dimensional integrated circuits; wafer level packaging; 3D TSV manufacturing; 3D ecosystem codesign; 3D electrical analysis; 3D interconnection bonding; 3D reliability; LED; MEMS integration; RF packaging; advanced flip chip underfill assembly; advanced wire bonding; area array packages; conductive adhesives; electromigration; flip chip interconnect; innovative test methods; integrated microfluidics; interposer technology; lead free solders; material characterization; next generation packaging reliability; nonconductive adhesives; optical interconnects; optoelectronics integration; power analysis; sensors; signal analysis; solder; thermal interface materials; wafer level manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6248796
  • Filename
    6248796