DocumentCode
2720915
Title
[Copyright notice]
fYear
2012
fDate
May 29 2012-June 1 2012
Firstpage
1
Lastpage
1
Abstract
The following topics are dealt with: 3D interconnection bonding; next generation packaging reliability; MEMS integration; signal and power analysis; LED; optoelectronics integration; 3D reliability; interposer technology; sensors; conductive and nonconductive adhesives; advanced flip chip underfill assembly; solder and material characterization; 3D TSV manufacturing; flip chip interconnect and electromigration; 3D electrical analysis; lead free solders; innovative test methods; 3D ecosystem codesign; RF packaging; area array packages; advanced wire bonding; wafer level manufacturing; thermal interface materials; optical interconnects; and integrated microfluidics.
Keywords
adhesion; electromigration; flip-chip devices; integrated circuit bonding; integrated circuit design; integrated circuit manufacture; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; integrated optoelectronics; lead bonding; light emitting diodes; microfluidics; optical interconnections; sensors; solders; three-dimensional integrated circuits; wafer level packaging; 3D TSV manufacturing; 3D ecosystem codesign; 3D electrical analysis; 3D interconnection bonding; 3D reliability; LED; MEMS integration; RF packaging; advanced flip chip underfill assembly; advanced wire bonding; area array packages; conductive adhesives; electromigration; flip chip interconnect; innovative test methods; integrated microfluidics; interposer technology; lead free solders; material characterization; next generation packaging reliability; nonconductive adhesives; optical interconnects; optoelectronics integration; power analysis; sensors; signal analysis; solder; thermal interface materials; wafer level manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4673-1966-9
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2012.6248796
Filename
6248796
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