Title :
Automated fault analysis in a smart grid
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
The latest technology development makes many intelligent electronic devices (IEDs) available in substations today. This brings an opportunity for adding new functionalities that go well beyond what the traditional substation automation solutions have provided. The substation automation role in automated fault analysis may be expanding towards better serving many utility groups: operations, protection and asset management.
Keywords :
fault diagnosis; substation automation; IED; asset management; intelligent electronic devices; smart grid automated fault analysis; substation automation; Automatic generation control; Centralized control; Circuit breakers; Circuit faults; Failure analysis; Fault location; Neural networks; Smart grids; Substation automation; Substation protection; expert system; genetic algorithm; intelligent electronic device; neural network; substation automation;
Conference_Titel :
Transmission & Distribution Conference & Exposition: Asia and Pacific, 2009
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-5230-9
Electronic_ISBN :
978-1-4244-5230-9
DOI :
10.1109/TD-ASIA.2009.5356957
