Author :
Polian, I. ; Tehranipoor, Mohammad
Author_Institution :
University of Passau
Keywords :
cryptography; globalisation; integrated circuit design; integrated circuit manufacture; integrated circuit reliability; invasive software; Trojan; counterfeit electronics; critical infrastructure; crypto hardware; electronic component supply chain; electronic system integrity; electronic system reliability; electronic system security; fabrication processes; globalisation; hardware security; integrated circuits; malicious activity; physical attacks; semiconductor design; side channel attacks; vulnerabilities;
Journal_Title :
Computers & Digital Techniques, IET
DOI :
10.1049/iet-cdt.2014.0194