DocumentCode :
2721097
Title :
Stress evolution in an encapsulated MEMS package due to viscoelasticity of packaging materials
Author :
Park, Seungbae ; Liu, Dapeng ; Kim, Yeonsung ; Lee, Hohyung ; Zhang, Sam
Author_Institution :
State Univ. of New York at Binghamton, Binghamton, NY, USA
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
70
Lastpage :
75
Abstract :
Packaging materials influence greatly on reliability and performance of electronics components. While, materials such as molding compound protect the package from the environment; different mechanical properties of materials will inevitably introduce stress to the package. In this study, materials´ viscoelastic effect on packaging stress in a MEMS sensor was studied using finite element analysis after measuring the properties of molding compound and die-attach materials in a series of stress relaxation experiments. The stress distribution, stress-time and stress-temperature relationship, were simulated under different final temperatures and cooling rates. It is found that viscoelasticity has significant effect on the packing stress, especially at higher temperature.
Keywords :
cooling; encapsulation; finite element analysis; internal stresses; micromechanical devices; moulding; packaging; viscoelasticity; cooling rates; die attach materials; electronics components; encapsulated MEMS package; finite element analysis; molding compound; packaging materials; packaging stress; stress distribution; stress evolution; stress relaxation experiments; stress temperature relationship; stress time relationship; viscoelastic effect; Compounds; Cooling; Materials; Micromechanical devices; Stress; Temperature; Temperature sensors; MEMS packaging; finite element analysis (FEA); molding compound; packaging stress; viscoelasticity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6248808
Filename :
6248808
Link To Document :
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