Title :
IDDQ testing and defect classes-a tutorial
Author :
Soden, Jerry M. ; Hawkins, Charles F.
Author_Institution :
Dept. of Failure Anal., Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
IDDQ testing of CMOS ICs is a technique for production quality and reliability improvement, design validation, and failure analysis. The origin and basic concepts of IDDQ testing are reviewed. The relationship of IDDQ testing to other test methods is considered in the context of the whole IC life cycle from design, fabrication, and test through end use. A comprehensive test strategy is described that uses defect classes based on defect electrical properties rather than traditional fault models
Keywords :
CMOS integrated circuits; electric current measurement; failure analysis; fault diagnosis; integrated circuit reliability; integrated circuit testing; leakage currents; logic testing; production testing; reviews; CMOS ICs; IDDQ testing; IC testing; defect classes; defect electrical properties; quiescent current testing; review; CMOS logic circuits; Circuit faults; Circuit testing; Fabrication; Failure analysis; Integrated circuit interconnections; Integrated circuit testing; Life testing; Production; Tutorial;
Conference_Titel :
Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-2584-2
DOI :
10.1109/CICC.1995.518262
