Title :
Testability features and the testability access of the Alpha 21164 microprocessor
Author :
Bhavsar, Dilip K. ; Fromm, Richard M.
Author_Institution :
Digital Semicond., Digital Equipment Corp., Hudson, MA, USA
Abstract :
This paper summarizes the testability features of the Alpha 21164 microprocessor chip and describes the design of the special test ports employed for accessing them
Keywords :
CMOS digital integrated circuits; built-in self test; computer testing; design for testability; integrated circuit testing; logic testing; microprocessor chips; Alpha 21164 microprocessor; BIST; CMOS IC; superscalar type; test ports; testability features; Built-in self-test; Circuit faults; Circuit testing; Controllability; Frequency; Logic testing; Manufacturing; Microprocessors; Observability; Semiconductor device testing;
Conference_Titel :
Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-2584-2
DOI :
10.1109/CICC.1995.518265
