Title :
Test synthesis in the microprocessor product development cycle
Author :
Acken, John M. ; Jani, Dhanendra D.
Author_Institution :
CrossCheck Technol. Inc., San Jose, CA, USA
Abstract :
In general the industry needs to move from a separate step of design for test to solving test issues as an integral part of the design process. Test synthesis can play a major role in enabling this transition. Some of the test automation problems facing microprocessor companies today will be faced by the rest of the industry very soon. This paper summarizes the size, quality, design composition, and design methodology issues that present challenges for test synthesis of microprocessors
Keywords :
automatic testing; computer testing; design for testability; integrated circuit testing; logic testing; microprocessor chips; product development; design methodology; microprocessor product development cycle; test automation; test synthesis; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Integrated circuit synthesis; Integrated circuit testing; Microprocessors; Product development; Production; System testing;
Conference_Titel :
Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-2584-2
DOI :
10.1109/CICC.1995.518266
