Title :
Millimeter-Wave Imaging Using Reverse-Microscope and Scanning System
Author :
Zhang, Zu-Cun ; Dou, Wen-Bin
Author_Institution :
State Key Lab. of Millimeter Waves, Southeast Univ., Nanjing
Abstract :
In this paper, firstly, focal field of Reverse-Microscope System (RMS) at millimeter wavelengths is analyzed, The contour diagram of electric field in the focal plane of RMS when the linearly polarized plane wave impact on it with different incident angles is calculated with ray-tracing method and Stratton-Chu vector diffraction integral formula. Then we add a scanning system in front of the RMS to form a Scanning Reverse-Microscope System (SRMS). The contour diagram of the SRMS is also calculated. The numerical results are very useful for us to design a millimeter-wave imaging system with low cost and high performance in our next work.
Keywords :
millimetre wave imaging; Stratton-Chu vector diffraction integral formula; contour diagram; focal field; linearly polarized plane wave; millimeter-wave imaging; ray-tracing method; reverse-microscope system; scanning reverse-microscope system; scanning system; Art; Conferences; Detectors; Diffraction; Lenses; Microwave Theory and Techniques Society; Microwave theory and techniques; Millimeter wave technology; Polarization; Ray tracing; Millimeter waves; RMS; focal plane array; scanning system;
Conference_Titel :
Art of Miniaturizing RF and Microwave Passive Components, 2008. IMWS 2008. IEEE MTT-S International Microwave Workshop Series on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2876-2
Electronic_ISBN :
978-1-4244-2877-9
DOI :
10.1109/IMWS.2008.4782288
