Millimeter-Wave Imaging Using Reverse-Microscope and Scanning System

Author

Zhang, Zu-Cun ; Dou, Wen-Bin

Author_Institution

State Key Lab. of Millimeter Waves, Southeast Univ., Nanjing

fYear

2008

fDate

14-15 Dec. 2008

Firstpage

161

Lastpage

163

Abstract

In this paper, firstly, focal field of Reverse-Microscope System (RMS) at millimeter wavelengths is analyzed, The contour diagram of electric field in the focal plane of RMS when the linearly polarized plane wave impact on it with different incident angles is calculated with ray-tracing method and Stratton-Chu vector diffraction integral formula. Then we add a scanning system in front of the RMS to form a Scanning Reverse-Microscope System (SRMS). The contour diagram of the SRMS is also calculated. The numerical results are very useful for us to design a millimeter-wave imaging system with low cost and high performance in our next work.

Keywords

millimetre wave imaging; Stratton-Chu vector diffraction integral formula; contour diagram; focal field; linearly polarized plane wave; millimeter-wave imaging; ray-tracing method; reverse-microscope system; scanning reverse-microscope system; scanning system; Art; Conferences; Detectors; Diffraction; Lenses; Microwave Theory and Techniques Society; Microwave theory and techniques; Millimeter wave technology; Polarization; Ray tracing; Millimeter waves; RMS; focal plane array; scanning system;

fLanguage

English

Publisher

ieee

Conference_Titel

Art of Miniaturizing RF and Microwave Passive Components, 2008. IMWS 2008. IEEE MTT-S International Microwave Workshop Series on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-2876-2

Electronic_ISBN

978-1-4244-2877-9

Type

conf

DOI

10.1109/IMWS.2008.4782288

Filename

4782288