Title :
Optimizing the timing center for high-speed parallel buses
Author :
Oh, Dan ; Vaidyanath, Arun ; Madden, Chris ; Frans, Yohan ; Kim, Woopoung
Author_Institution :
Rambus Inc., Los Altos, CA, USA
fDate :
May 29 2012-June 1 2012
Abstract :
As data rates continue to increase, the quality of the transmitted signal is not the only important factor in the design of modern high-speed I/O interfaces; accurate positioning of the receiver clock, in order to detect an incoming signal, is also critical. Modern high-speed I/O interfaces, including both parallel and memory buses (such as Elastic Interface, QuickPath Interconnect, HyperTransport, XDR DRAM, and GDDR5 DRAM buses), already include a data-training feature used to center the receiver clock. This paper describes the general principles used in various timing centering algorithms. Specifically, two different approaches, based on the worst-case eye opening and the median of eye fuzz, are compared. The timing center can drift significantly, due to temperature variation and low frequency supply voltage noise, and consequently requires periodic updates. This paper presents an efficient way to track this timing drift periodically. In mobile applications, some of the low-power modes of operations prohibit the use of the periodic timing calibration to minimize power consumption. A novel scheme to avoid this power consumption is also introduced.
Keywords :
DRAM chips; clocks; high-speed integrated circuits; logic design; low-power electronics; peripheral interfaces; system buses; GDDR5 DRAM buses; HyperTransport; QuickPath interconnect; XDR DRAM; data-training feature; elastic Interface; eye fuzz; high-speed I/O interfaces; high-speed parallel buses; low-power modes; memory buses; periodic timing calibration; power consumption; receiver clock; timing center; worst-case eye opening; Accuracy; Calibration; Clocks; Jitter; Mixers; Receivers; Timing;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2012.6248823