Title :
Disease classification: A probabilistic approach
Author :
Rathi, Yogesh ; Malcolm, J. ; Bouix, S. ; McCarley, R. ; Seidman, L. ; Goldstein, J. ; Westin, C.-F. ; Shenton, M.E.
Author_Institution :
Med. Sch., Harvard Univ., Boston, MA, USA
Abstract :
We describe a probabilistic technique for separating two populations whereby analysis is performed on affine-invariant representations of each patient. The method begins by converting each voxel from a high-dimensional diffusion weighted signal to a low-dimensional diffusion tensor representation. Three orthogonal measures that capture different aspects of the local tissue are derived from the tensor representation to form a feature vector. From these feature vectors, we form a probabilistic representation of each patient. This representation is affine invariant, thus obviating the need for registration of the images. We then use a Parzen window classifier to estimate the likelihood of a new patient belonging to either population. To demonstrate the technique, we apply it to the analysis of 22 first-episode schizophrenic patients and 20 normal control subjects. With leave-many-out cross validation, we find a detection rate of 90.91% (10% false positives).
Keywords :
affine transforms; biodiffusion; biomedical MRI; diseases; image classification; medical image processing; probability; Parzen window classifier; affine-invariant representations; diffusion weighted signal; disease classification; feature vector; image registration; low-dimensional diffusion tensor representation; probabilistic technique; schizophrenia; Anisotropic magnetoresistance; Biomedical imaging; Diffusion tensor imaging; Diseases; Image analysis; Magnetic analysis; Magnetic resonance imaging; Neuroimaging; Performance analysis; Tensile stress; Classification; Diffusion Tensor Imaging (DTI); affine-invariant; schizophrenia;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
Conference_Location :
Rotterdam
Print_ISBN :
978-1-4244-4125-9
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2010.5490246