DocumentCode
2721735
Title
Automatic system for diabetic retinopathy screening based on AM-FM, partial least squares, and support vector machines
Author
Barriga, E. Simon ; Murray, Victor ; Agurto, Carla ; Pattichis, Marios ; Bauman, Wendall ; Zamora, Gilberto ; Soliz, Peter
Author_Institution
VisionQuest Biomed., Albuquerque, NM, USA
fYear
2010
fDate
14-17 April 2010
Firstpage
1349
Lastpage
1352
Abstract
Diabetic retinopathy (DR) is a disease that affects over 170 million people worldwide. In the United States, it is estimated that over 10 million diabetics do not receive the recommended annual eye examinations, significantly increasing their risk of vision loss. In this paper we present an automatic system to detect the presence of DR by analyzing a photograph of the central field of the retina. The system applies Amplitude Modulation-Frequency Modulation (AM-FM) for feature extraction, and partial least squares (PLS) and support vector machines (SVM) for classification. We tested the system on a total of 400 images, and obtained an area under the ROC curve (AUC) of 0.86, and corresponding sensitivity/specificity of 98%/68%. We also tested the accuracy of the system for patients needing immediate referral to a specialist, obtaining an AUC of 0.98.
Keywords
biomedical optical imaging; diseases; eye; feature extraction; image classification; least squares approximations; medical image processing; patient diagnosis; support vector machines; AM-FM; ROC curve; amplitude modulation-frequency modulation; diabetic retinopathy screening; feature extraction; partial least squares; pattern classification; photograph; retina; support vector machines; vision loss; Amplitude modulation; Diabetes; Diseases; Least squares methods; Retina; Retinopathy; State estimation; Support vector machine classification; Support vector machines; System testing; AM-FM; Diabetic retinopathy; amplitude modulation-frequency modulation; partial least squares; support vector machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
Conference_Location
Rotterdam
ISSN
1945-7928
Print_ISBN
978-1-4244-4125-9
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2010.5490247
Filename
5490247
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