Title :
Proceedings. IEEE International SOC Conference (IEEE Cat. No. 05TH8822)
Abstract :
The following topics are dealt with: frequency synthesizers and generators; SOC design; design for testability; SOC architecture; embedded systems; sensors; MEMS; low power memory; radio frequency and optical circuits; signal integrity; and on-chip interconnections.
Keywords :
design for testability; embedded systems; frequency synthesizers; integrated circuit design; integrated circuit interconnections; low-power electronics; system-on-chip; MEMS; SOC architecture; design for testability; embedded systems; frequency generators; frequency synthesizers; low power memory; on-chip interconnections; optical circuits; radio frequency; sensors; signal integrity; system-on-chip design;
Conference_Titel :
SOC Conference, 2005. Proceedings. IEEE International
Conference_Location :
Herndon, VA
Print_ISBN :
0-7803-9264-7
DOI :
10.1109/SOCC.2005.1554432
