• DocumentCode
    2721968
  • Title

    Future Memory Devices - from Stacked memory, Gain memory, Single-electron memory to Molecular memory

  • Author

    Nakazato, Kazuo

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Nagoya Univ.
  • fYear
    2006
  • fDate
    24-26 April 2006
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Future possibilities for high speed memories will be discussed. In stacked memories, vertical MOSFETs are stacked onto MOSFETs. A 500 MHz 64 Mbit SRAM was demonstrated with reduced cell area, 60% of planar cell. PLEDM was proposed as a scalable DRAM gain cell which leads to single-electron memories. The transfer and detection of one electron was demonstrated using SOI structures at 4.2K. To achieve the room-temperature operations, nodes must be formed in atomic scale, and molecular memories should be investigated
  • Keywords
    DRAM chips; MOS memory circuits; SRAM chips; 4.2 K; 500 MHz; 64 Mbit; DRAM; PLEDM; SOI structures; SRAM; gain memory; high speed memories; memory devices; molecular memory; single-electron memory; stacked memory; vertical MOSFET; Grain boundaries; Heterojunctions; MOSFETs; Random access memory; Semiconductor diodes; Silicon; Single electron memory; Thermionic emission; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 2006 International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    1-4244-0181-4
  • Electronic_ISBN
    1524-766X
  • Type

    conf

  • DOI
    10.1109/VTSA.2006.251114
  • Filename
    4016587