Title :
Wide Angle Impedance Matching techniques for volumetrically scanned phased arrays
Author :
Sikina, Thomas V.
Author_Institution :
Integrated Defense Syst. Integrated Defense Syst., Raytheon Co., Sudbury, MA, USA
Abstract :
The scan and frequency dependent aperture surface impedance is a useful way to study the effects of the active phased array. The surface impedance of an ideal current sheet diverges for orthogonal E- and H-plane polarizations at large scan angles, based on fundamentals. This phenomenon can be reproduced in the phased array unit cell using modern Finite Element Modeling techniques. It can also be corrected within a limited frequency range using complex conjugate matching schemes, which are also termed Wide Angle Impedance Matching (WAIM) techniques. While these latter techniques often introduce surface wave resonance effects, a parasitic element approach satisfies the complex conjugate condition with minimal surface wave effects. This last approach includes the geometry found in a stacked patch radiator.
Keywords :
antenna phased arrays; electromagnetic wave polarisation; finite element analysis; geometry; impedance matching; complex conjugate matching schemes; finite element modeling techniques; frequency dependent aperture surface impedance; orthogonal E-plane polarizations; orthogonal H-plane polarizations; phased array unit cell; scan dependent aperture surface impedance; stacked patch radiator; volumetrically scanned phased arrays; wide angle impedance matching techniques; Apertures; Bandwidth; Dielectrics; Impedance; Phased arrays; Surface impedance; Surface waves;
Conference_Titel :
Phased Array Systems and Technology (ARRAY), 2010 IEEE International Symposium on
Conference_Location :
Waltham, MA
Print_ISBN :
978-1-4244-5127-2
Electronic_ISBN :
978-1-4244-5128-9
DOI :
10.1109/ARRAY.2010.5613252