DocumentCode
2722127
Title
Aging impact on the accelerated thermal cycling performance of lead-free BGA solder joints in various stress conditions
Author
Lee, Tae-Kyu ; Ma, Hongtao
Author_Institution
Component Quality & Technol. Group, Cisco Syst., Inc., San Jose, CA, USA
fYear
2012
fDate
May 29 2012-June 1 2012
Firstpage
477
Lastpage
482
Abstract
Isothermal aging effects on lead-free solders have been extensively investigated in recent studies for both bulk solders and package solder joints. Researches show that aging significantly degrades the mechanical properties of bulk lead-free solders and dynamic performances of lead-free solder joints. There are studies exploring the impact of aging on accelerated thermal cycling (ATC) performance of lead-free solder joints, however, the results are discrepant, some research shows minimal impact of isothermal aging on long term ATC performances since most of the failure mode are not related to intermetallic (IMC) growth which has been impacted more significantly during aging. Some others show significant degradation of the of ATC life due to evidence of weakening of solder joints after aging. This study is intended to explore the factors that may affect the aging impact on the lead-free solder joint fatigue life. The test vehicle is designed with different package types, pitch sizes, and solder alloy metallurgies to capture the impact of affecting factors. The test vehicles have been aged at 100°C and 150°C for different aging durations, ATC test were subsequently performed on the aged samples and with the non aged samples as control. The effects of aging on the fatigue life of lead-free solder joints are extensively explored in this study.
Keywords
ageing; ball grid arrays; failure analysis; fatigue; metallurgy; solders; accelerated thermal cycling; aging impact; bulk lead-free solders; failure mode; fatigue life; intermetallic growth; isothermal aging effects; lead-free BGA solder joints; mechanical properties; solder alloy metallurgies; stress conditions; temperature 100 degC; temperature 150 degC; Aging; Degradation; Isothermal processes; Metals; Microstructure; Soldering; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4673-1966-9
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2012.6248874
Filename
6248874
Link To Document