• DocumentCode
    2722540
  • Title

    Proceedings International Test Conference 1990 (Cat. No.90CH2910-6)

  • fYear
    1990
  • fDate
    10-14 Sept. 1990
  • Abstract
    The following topics are dealt with: advances in test pattern generation; ISDN (integrated services digital network) device testing; hierarchy in test generation; concurrent engineering; testers for the 1149.1 boundary scan; test techniques for microprocessors; design for testability; CMOS IC testing with IDDQ current monitoring; new analysis techniques in BIST (built-in self-test); parallelism and concurrence in fault simulation; wafer probing methods and high-speed fixturing; fault coverage and latchup issues; and contactless probing.
  • Keywords
    CMOS integrated circuits; ISDN; automatic test equipment; automatic testing; circuit CAD; digital simulation; electronic equipment testing; fault location; integrated circuit testing; logic testing; microprocessor chips; parallel processing; production testing; ATE; BIST; CMOS IC; IC testing; ISDN; boundary scan; built-in self-test; concurrence; contactless probing; current monitoring; fault coverage; fault simulation; high-speed fixturing; integrated services digital network; latchup; logic testing; microprocessors; parallelism; production testing; test pattern generation; testability; wafer probing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1990. Proceedings., International
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-8186-9064-X
  • Type

    conf

  • DOI
    10.1109/TEST.1990.113987
  • Filename
    113987
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2722540